(廣西大學材料科學研究所, * 廣西大學物理系, 南寧 530004)
摘 要: 報道了ErCoSn的X射線粉末衍射數(shù)據(jù), 并運用Rietveld 法對X射線衍射譜進行了精化。ErCoSn是正交結(jié)構(gòu), 空間群Pnma, a=7.1341A, b=4.5045A, c=7.4611A, V =239.77A3, Dx=9.553g·cm-3, Z=4, Rp=11.48%,
R wp=14.84%, 品質(zhì)因數(shù)F30=52(0.0093, 62)。
關(guān)鍵字: ErCoSn X射線粉末衍射 Rietveld精化
(Institute of Materials Science, Guangxi University, Nanning 530004, P. R. China
* Department of Physics, Guangxi University, Nanning 530004, P. R. China)
Abstract:The X-ray diffraction data of ErCoSn has been reported and the XRD pattern was refined by Rietveld method. The compound ErCoSn is orthorhombic with space group Pnma(62), a=7.1341A, b=4.5045A, c=7.4611A, V=239.77 A3, Dx=9.553 g·cm-3 and Z=4 formula units per cell. The R factors Rp=11.48%, R wp=14.84% and the figure of merit F30=52(0.0093, 62) were obtained.
Key words: ErCoSn; X; ray powder diffraction; Rietveld refinement


