(廈門金鷺特種合金有限公司 技術(shù)研究與發(fā)展中心，
廈門 361006)
摘 要: 用X射線衍射研究粒度10.86～0.124μm系列WC粉末的粒度效應(yīng)。隨粒度變小，衍射線線形發(fā)生明顯變化，從敏銳到極其漫散。亞微 米級粒度的WC粉末譜線半高寬隨粒度變細(xì)顯著變化，半高寬是度量粒度效應(yīng)的主要指標(biāo)，而對于微米級粒度的粒度效應(yīng)則可應(yīng)用譜線背底寬度來衡量。極細(xì)和超細(xì)粒度WC粉末衍射譜線的2θ位置明顯偏離平衡位置， 這與臨近納米粒度有關(guān)。WC粉末衍射強度也隨粒度產(chǎn)生明顯變化，衍射強度隨粒度變細(xì)的變化規(guī)律與半高寬的規(guī)律呈反轉(zhuǎn)對應(yīng)關(guān)系。應(yīng)用WC粉末X射線衍射的粒度效應(yīng)，尤其是譜線寬化的規(guī)律作為評定亞微米級WC粉末粒度尤其是極細(xì)和超細(xì)粒度，是有應(yīng)用前景的。
關(guān)鍵字: WC粉末；粒度；粒度效應(yīng)；X射線衍射；譜線寬化
（R&D Centre, Xiamen Golden Egret Special Alloy Co., Ltd,
Xiamen 361006, China）
Abstract:Effects of WC powder particle sizes from 1 0.86 to 0.124μm were investigated by X-ray diffraction. With the size fined, X-ray diffraction spectra change as follows: X-ray diffraction profiles evidently vary from sharp to diffuse, spectral line broadening, intensity changing, and diffraction peak (2θ) removed.
Key words: WC powder; particle size; effect of particle size; X-ray diffraction; line broadening
