(北京科技大學(xué) 材料科學(xué)與工程學(xué)院，北京 100083)
摘 要: 采用織構(gòu)定量檢測、EBSD微取向分析、晶粒尺寸分析等手段研究了退火加熱過程對高壓電解電容器陽極鋁箔立方織構(gòu)的影響。結(jié)果表明：鋁箔在最終退火加熱中分別經(jīng)歷了初次再結(jié)晶和晶粒長大兩個主要過程，兩過程互有重疊，其中在300℃適當(dāng)完成初次再結(jié)晶并在500℃促使立方取向晶粒長大有利于提高最終的立方織構(gòu)量；在500℃長時間加熱有可能誘發(fā)晶粒異常長大，并降低立方織構(gòu)量。
關(guān)鍵字: 電子鋁箔；立方織構(gòu)； 退火； 再結(jié)晶
cube texture formation in aluminum foil
of high voltage anode electrolytic capacitor
（School of Materials Science and Engineering， University of
Science and Technology Beijing， Beijing 100083， P.R.China）
Abstract:The influence of annealing process on the cube texture formation in aluminum foil of high voltage anode electrolytic capacitor was investigated using the quantitative texture analysis，EBSD micro-orientation analysis，as well as grain size measurement. It is shown that the two main processes of primary recrystallization and grain growth are carried out during the final annealing. The two processes are overlapped each other in certain extent，in which strongercube texture can be formed if the primary recrystallization is completed properly at 300 ℃ and the cube grain grow further at 500℃. The annealing at 500℃ for very long time will induce an abnormal grain growth and reduce the cube texture component.
Key words: electron aluminum foil； cube texture； annealing； recrystallization
