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中國(guó)有色金屬學(xué)報(bào)

ZHONGGUO YOUSEJINSHU XUEBAO

第18卷第10期總第115期 2008年10月

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文章編號(hào)：1004-0609(2008)10-1819-06

利用FE-SEM分析Al-Si-Mg系和Al-Mg-Si系合金中Mg2Si沉淀相

李建國(guó)，譚紅艷，史子木，何遷

(清華大學(xué) 材料科學(xué)與工程系，北京 100084)

摘要:

以Al-Si-Mg系的A356合金和Al-Mg-Si系的6061合金中的Mg₂Si沉淀相為研究對(duì)象，通過(guò)場(chǎng)發(fā)射掃描電子顯微鏡(FE-SEM)的In-lens探頭及低電壓模式，分析Mg₂Si沉淀相的析出情況及其表面形貌。結(jié)果表明：在低電壓模式及In-lens探頭雙重條件下，可獲得較好分辨率的Mg₂Si沉淀相表面立體顯微形貌；通過(guò)透射電子顯微鏡衍射分析發(fā)現(xiàn)在掃描電子顯微鏡中觀察到的相確實(shí)為Mg₂Si沉淀相。這種分析方法能夠清晰觀察到Mg₂Si沉淀相的普遍析出情況。

關(guān)鍵字: Al-Si-Mg合金；Al-Mg-Si合金；Mg2Si沉淀相；FE-SEM；In-lens探頭

Analysis of Mg2Si precipitates in Al-Si-Mg and Al-Mg-Si alloys by FE-SEM

LI Jian-guo, TAN Hong-yan, SHI Zi-mu, HE Qian

（Department of Materials Science and Engineering, Tsinghua University, Beijing 100084, China）

Abstract: The distribution and morphology of Mg2Si precipitates in both Al-Si-Mg alloys (A356 alloy) and Al-Mg-Si alloys (6061 alloy) were observed by FE-SEM with an In-lens detector and in low voltage mode. The results suggest that the morphology image of Mg2Si precipitates can get better high-resolution only if observation is by FE-SEM in low voltage mode and with the In-lens detector. The precipitates were also analyzed by TEM and proved to be Mg2Si. The method can be used to observe general distribution of Mg2Si precipitates in the matrix clearly.

Key words: Al-Si-Mg alloys; Al-Mg-Si alloys; Mg2Si precipitates; FE-SEM; In-lens detector

ISSN 1004-0609
CN 43-1238/TG
CODEN: ZYJXFK

ISSN 1003-6326
CN 43-1239/TG
CODEN: TNMCEW