中國(guó)有色金屬學(xué)報(bào)(英文版)
Transactions of Nonferrous Metals Society of China
| Vol. 2 No. 3 August 1992 |
EFFICIENT TOPOGRAPHIC CORRECTIONS FOR RESISTIVITY DATA
He Jishan
（Central South University of Technology,Changsha 410083,China）
Abstract:The development of topography effect correction on resistivity data was summed up.Mainly the correction technique based on angular domain superposition and ratio method was discussed to solve point source and 2-D topography problem. The nature of ratio topography correction was proved and the results were spread to point source. Based on systematicahy studying anomalies of angular domains with different angles,a fast method of topography correction was presented which can be run on personal computer and get resonable accuracy.
Key words: topographic correction angular domain cubic spline
