中國有色金屬學報(英文版)
Transactions of Nonferrous Metals Society of China
| Vol. 8 No. 4 December 1998 |
X-RAY POWDER DIFFRACTION DATA AND STRUCTURE REFINEMENT OF COMPOUND ErNi2Si2
Yan Jialin1 Ou Xiangli1 and Zeng Lingmin1 Hao Jianmin2
（1.Institute of Materials Science, Guangxi University, Nanning530004, P. R. China
2.Tianjin Electronic Materials Research Institute, Tianjin 300192, P. R. China）
Abstract:The X-ray powder diffraction data for ErNi2Si2are given and the crystal structure has been refined by the Rietveld whole-pattern-fitting method. The compound ErNi2Si2crystallizes with the ThCr2Si2 type structure (tetragonal, space group I4/mmm,Z=2). The refined lattice parameters area=3.9321(1),c=9.5237(1) and the structure was refined toRp=13.09%,Rwp=16.69%. The figure of meritFN for the powder data isF30=108.2 ( 0.0063,44 ).
Key words: ErNi2Si2 X-ray powder diffraction Rietveld structure refinement
