中國(guó)有色金屬學(xué)報(bào)(英文版)
Transactions of Nonferrous Metals Society of China
| Vol. 11 No. 4 August 2001 |
epitaxial YBa2Cu3O7-δ thin films
（State Key Laboratory of Advanced Technology for Materials Synthesis and Processing,
Wuhan University of Technology, Wuhan 430070, P.R.China）
Abstract:Isothermal oxygen in-diffusion in c-textured epitaxial YBa2Cu3O7-δ thin films was studied by in situ X-ray diffraction. Thermal expansion coefficients of c-axis length with different oxygen contents are αc (6.91, O2)=19.1×10-6K-1and αc(6.0, N2)=19.3×10-6 K-1 respectively. Chemical diffusion process of oxygen was described by relaxation time. From the Arrhenius plot of relaxation time, an activation energy of lattice diffusion was obtained as 1.1eV,which is close to the results of SIMS (0.95 eV) and internal friction (1.02 eV).
Key words: oxygen diffusion; in situ X-ray diffraction; relaxation time
