中國有色金屬學(xué)報(英文版)
Transactions of Nonferrous Metals Society of China
| Vol. 15 No. 2 April 2005 |
ZHU Yu-liang(褚于良)1, SUN Huan-de(孫煥德)2
（1. School of Materials Science and Engineering, Shanghai University,
Shanghai 200072, China;
2. Research and Development Center, Baoshan Iron and Steel Co Ltd,
Shanghai 201900, China）
Abstract:Field emission-scanning electron microscopy(FE-SEM) technique was employed to observe the shape, size and distribution of AlN+MnS inclusions in oriented electrical steels. Specimens used for FE-SEM observation were deeply electrolytic etched at room temperature in non-aqueous acetylacetone(AA) solution. The results indicate that the FE-SEM technique has obvious advantage in specimen preparation. Therefore, it can be easily used to identify the AlN+MnS inclusions and even copper nano-particles in oriented electrical steels with the same analysis accuracy as that by TEM. This technique is a good substitute for TEM and the associated specimen preparation in the observation of inclusions in electrical steels. It will be a powerful technique for routine analysis in the production of grain oriented electrical steels.
Key words: oriented electrical steels; field emission-scanning electron microscopy(FE-SEM); inclusions
